- Contact Person : Mr. JI Jim
- Company Name : Opwill Technologies (Beijing) Co., Ltd.
- Tel : 86-010-82771386-828
- Fax : 86-010-82771782
- Address : Beijing,Beijing,Room 415,Digital Media Building,No.7 Shangdi Inoformation Road,Haidian District,Beijing,PRC,10085
- Country/Region : China
- Zip : 100085
OTN Test Module
Related Product Searches:OTN Test Module,High Quality,OTN tester, Transport Tester,OTM2540
OTM2540 43G OTN transport tester can be configured on OTP6800 test platforms to achieve OTN test functionalities and offer comprehensive test solutions for metro network.
OTM2540 OTN tester is a high cost-effective network tester. It supplies complete metro test functionalities for service provider deploying , running and maintaining transport network.
OTN Test Features
1.Support OTU3 (43Gbit/s) optical interface relative tests
2.BERT and FEC analysis of OTU3 as per ITU-T G.709 frames
3.2.5G/10G SDH/SONET signal synchronous/asynchronous mapping and demapping in OTN
4.Round-trip delay measurements
5.Independent transmitter and receiver testing
6.OTN alarm generation and monitoring
7.OTN overhead manipulation and capture
8.Frequency analysis and power measurement
9.Frequency offset generation
10.Automatic protection switching and service discruption time measurements
11.Senior through mode measurement
OTM2540 OTN Series Specifications | |||
Test Interfaces | |||
OTU3(43G) optical interface | |||
BNC DS1/E1/2MHz outside clock interface | |||
Test Features | |||
OTN | |||
Payloads | Support mapping/demapping from AU-3/AU-4/AU-4-4c/AU-4-16c to OTU1 Support mapping/demapping from AU-3/AU-4/AU-4-4c/AU-4-16c/AU-4-64c to OTU2 Support multiplexing/demultiplexing from ODU0,ODU1,ODU2,ODUflex to ODU3 | ||
Test patterns | PBBS | 2E23,2E31 | |
Fixed | All 1s,All 0s | ||
User programmable | Allowing user define 8-byte test pattern | ||
Error injection | FAS,BIP-8(SM, PM, TCM1-6),BEI(SM, PM, TCM1-6), Bit,FECcorrectable bit, FECcorrectable code word, FECuncorrectable code word,Fec correctable Symbol | ||
Alarm generation | OTU:LOF,OOF ,LOM, OOM,AIS,SM-BDI,SM-IAE,SM-TIM,SM-BIAE ODU:ODTU-LOFLOM,ODU-AIS,ODU-OCI,ODU-LCK,ODU-BDI,ODU-TIM,ODU-FSF,ODU-BSF,ODU-FSD,ODU-BSD ODU-TCM1~6:BDI,IAE,TIM,LTC,BIAE OPU:OPU-PLM,OPU-CSF,OPU-MSIM,CLIENT-LSS | ||
Test result | Error | FAS,BIP-8(SM, PM, TCM1-6),BEI(SM, PM, TCM1-6), Bit,FECcorrectable bit, FECcorrectable code word, FECuncorrectable code word | |
Alarm | OTU:LOF,OOF,LOM, OOM ,AIS,SM-BDI,SM-IAE,SM-TIM,SM-BIAE ODU:AIS,ODU-OCI,ODU-LCK TCM1~6:BDI,IAE,TIM,LTC,BIAE PM:BDI,TIM | ||
Overhead features | Manipulation and capture
| Overhead setting: all bytes are editable, not including MFAS, SM BIP, PM BIP, TCM1-6 BIP Continuous and variable capture ability Display integrated overhead | |
Protection switching time | Term of service disruption | Alarm: LOS, LOM, OOM, SM-IAE, SM-BIAE, ODU-AIS, ODU-OCI, ODU-LCK, PM-BDI; Error: MFAS, PM-BIP, PM-BEI, payload errors | |
Delay | Time test precision 0.1ms | ||
Other Test and Measurement Functions | |||
Power measurement | Support power measurement of optical interface(dBm). Precision:0.1dBm. Range:-40~+8.2dBm | ||
Frequency measurement | Support clock frequency measurement of optical interface(measure received frequency of input signal and deviation with rating frequency), display in b/s(bps) and ppm. PrecisionL 1b/s and 1 ppm | ||
Frequency offset generation | Support to offset signal transmission clock in selected interface, and recover the circuit through tested network clock. Generation range:-100ppm~+100ppm | ||
Loop-back delay measurement | Measure the time of one overhead sending from OTM2540 TX and loop-back then back to RX. Suitable for all interfaces and mapping. MeasurementL final RTD time, minimum calue, maximum value, average value, measured count(successful TRD measurement number), loss measurement count. | ||
Through mode | Support OTU3 high level through mode | ||
Path scan | Automatically scan pointed signal structure path | ||
OTN Test Module
