Opwill Technologies (Beijing) Co., Ltd.
Main products:Gigabit Ethernet Tester,OTDR Tester,STM 1/4/16/64 SDH Analyzer,2.7G/10G OTN Analyzer,10 Gigabit Ethernet Tester
Products
Contact Us
  • Contact Person : Mr. JI Jim
  • Company Name : Opwill Technologies (Beijing) Co., Ltd.
  • Tel : 86-010-82771386-828
  • Fax : 86-010-82771782
  • Address : Beijing,Beijing,Room 415,Digital Media Building,No.7 Shangdi Inoformation Road,Haidian District,Beijing,PRC,10085
  • Country/Region : China
  • Zip : 100085

SDH/PDH/MSTP Analyzer

SDH/PDH/MSTP Analyzer
Product Detailed
MSTP analyzer tester offer complete next-generation MSTP test functionalities and comprehensive test solutions for metro network

Overview:

OTM2500 next-generation MSTP transport test module analyzer  is one of OPWILL’s modular test products. OTM2500 series can be configured on OTP6200 and OTP6800 test platforms to achieve complete next-generation MSTP test functionalities and offer comprehensive test solutions for metro network. It is a high cost-effective next-generation network test product.

Offer test functions from PDH/DSn1.5M to 2.5G/10G SDH/SONET/MSTPMSTP testing via GFP, VCAT and LCAS optionsAutomatic signal structure discovery in smartmode, automatically detect and monitor error pathsIntuitionistic user interface, fast configuration of signal pathsCustomizable various forms of test report2-slot designed can be housed in OTP6200 and OTP6800 platforms.

PDH / SDH / MSTP Test Features

1.Support various PDH/SDH test interfaces: 1.5M/2M/34M/45M/140M/155M electrical interface, 155M/622M/2.5G/10G optical interface

2.Ethernet test interface: 10/100/1000M Ethernet electrical interface, 100/1000M SFP optical interface

3.Mixed and bulk payload generation and analysis from 1.5Mbit/s to 10 Gbit/s

4.High-order and low-order mappings

5.Round-trip delay measurements

6.Independent transmitter and receiver testing

7.High-order and low-order pointer generation and monitoring

8.All PDH/SDH/SONET interfaces support End-to-end or loopback BER testing

9.Section/RS, line/MS, high-order and low-order path overhead manipulation and monitoring, alarm/error generation and monitoring

10.Tandem connection monitoring

11.Performance monitoring: G.821,G.826,G.828,G.829,M.2100,M.2101

12.Frequency analysis and power measurement

13.Frequency offset generation

14.Automatic protection switching and service disruption time measurements

 

Next-Generation SDH Test Features

Generic framing procedure (GFP)

• Conform to ITU-T G.7041 and ANSI T1.105-2001

• GFP-F support

• GFP header control, error injection and detection

• GFP over LO VCAT/HO VCAT

Virtual concatenation(VCAT)

• Conform to ITU-T G.707, Telcordia GR253 and ANSIT1.105-2001

• SDH error performance analysis per ITU-T G.821,G.828,G.829,M.2101, M.2110, M.2120 and Telcordia GR253

• Virtual concatenation testing, VC-11, VC-12 , VC-3 and VC-4; synchronously test on 64 VC-11 & VC-12 members/48 VC-3 memebers/16 VC-4 members

•Differential delay generation, measurement and payload reassembly up to 256ms

•Path overhead bytes control and decode on each member

• Error injection and alarm generation on each member

• Independent control and monitoring on each path

Link capacity adjustment scheme (LCAS)

• Conform to ANSI T1.105, ITU-T G.7042, G.707, 783, 806

• LCAS protocol emulation

• Emulation of Source and Sink state mechines per member

• Generation and capture of member status information

• All optical interfaces and electrical interfaces (SDH) support HO & LO VCAT

Ethernet over SDH/SONET(EoS)

• Support 10/100/1000 M Base-T Ethernet interface and gigabit optical interface

• Ethernet payload add/drop in SDH line with GFP mapping

• Flexible generation and statistics of Ethernet frame, including layer2 and layer3 testing with VLAN and MPLS label

• Various Ethernet payload patterns (PRBS)

SDH/PDH/MSTP Analyzer



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